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Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents /

Foster, Adam.

Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents / [electronic resource] : by Adam Foster, Werner Hofer. - New York, NY : Springer Science+Business Media, LLC, 2006. - xiv, 281 pages : illustration, digital ; 25 cm. - NanoScience and Technology, 1434-4904 .

ISBN: 9780387372310 (electronic bk.)

Subjects--Topical Terms:
Scanning probe microscopy.

LC Class. No.: QH212.S33 / F68 2006

Dewey Class. No.: 502.82

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