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Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings /

Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings / [electronic resource] : edited by Dit-Yan Yeung ... [et al.]. - Berlin Heidelberg : Springer-Verlag GmbH., 2006 - xxi, 939 pages : illustration, digital ; 24 cm. - Lecture Notes in Computer Science, 4109 0302-9743 ; .

ISBN: 9783540372417 (electronic bk.)

Subjects--Topical Terms:
Pattern recognition systems--Congresses.

LC Class. No.: TK7882.P3 / I57 2006

Dewey Class. No.: 006.4

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Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings /

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