Normal view MARC view ISBD view

Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications /

Rein, Stefan.

Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications / [electronic resource] : by Stefan Rein. - Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2005. - xxvi, 489 p. : ill., digital ; 25 cm. - Springer Series in Material Science, 85 0933-033X ; .

ISBN: 9783540279228 (electronic bk.) 9783540253037 (paper)

Subjects--Topical Terms:
Silicon crystals--Defects.
Silicon crystals--Spectra.
Physics.
Optical and Electronic Materials.
Solid State Physics and Spectroscopy.

LC Class. No.: TK7871.15.S55 / R45 2005

Dewey Class. No.: 537

Print
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)

Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications /

Contact Us

Copyright ©The National University of Malaysia Library