Introduction to Focused Ion Beams Instrumentation, Theory, Techniques and Practice /
Introduction to Focused Ion Beams Instrumentation, Theory, Techniques and Practice / [electronic resource] :
edited by Lucille A. Giannuzzi, Fred A. Stevie.
- Boston, MA : Springer Science+Business Media, Inc., 2005.
- xiv, 357 p. : ill., digital ; 25 cm.
9780387233130 (electronic bk.) 9780387231167 (paper)
Focused ion beams.
Physics.
Optical and Electronic Materials.
Surfaces and Interfaces, Thin Films.
Condensed Matter.
Solid State Physics and Spectroscopy.
QC702.7.B65 / I63 2005
621.38152
9780387233130 (electronic bk.) 9780387231167 (paper)
Focused ion beams.
Physics.
Optical and Electronic Materials.
Surfaces and Interfaces, Thin Films.
Condensed Matter.
Solid State Physics and Spectroscopy.
QC702.7.B65 / I63 2005
621.38152
