Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK /
Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK / [electronic resource] :
edited by A. G. Cullis, J. L. Hutchison.
- Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2005.
- xvi, 537 p. : ill., digital ; 24 cm.
- Springer Proceedings in Physics, 107 0930-8989 ; .
9783540319153 (electronic bk.) 9783540319146 (paper)
Semiconductors--Surfaces--Congresses.
Semiconductors--Characterization--Congresses.
Materials--Microscopy--Congresses.
Epitaxy--Congresses.
High resolution electron microscopy--Congresses.
Chemistry.
Materials Science.
Electronics and Microelectronics, Instrumentation.
Solid State Physics and Spectroscopy.
Measurement Science, Instrumentation.
QC611.6.S9 / M554 2005
621.38152
9783540319153 (electronic bk.) 9783540319146 (paper)
Semiconductors--Surfaces--Congresses.
Semiconductors--Characterization--Congresses.
Materials--Microscopy--Congresses.
Epitaxy--Congresses.
High resolution electron microscopy--Congresses.
Chemistry.
Materials Science.
Electronics and Microelectronics, Instrumentation.
Solid State Physics and Spectroscopy.
Measurement Science, Instrumentation.
QC611.6.S9 / M554 2005
621.38152