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CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms /

Li, Flora M..

CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms / [electronic resource] : by Flora M. Li, Arokia Nathan. - Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2005. - 1online resource (xi, 231 p.) : ill., digital ; 25 cm. - Microtechnology and Mems, 1615-8326 .

ISBN: 9783540274124 (electronic bk.) 9783540226802 (paper)

Subjects--Topical Terms:
Image processing--Digital techniques.
Remote sensing.
Service life (Engineering)
Charge coupled devices.

Dewey Class. No.: 621.364

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CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms /

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