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Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM /

Egerton, Ray F..

Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM / [electronic resource] : by Ray F. Egerton. - Boston, MA : Springer Science+Business Media, Inc., 2005. - xii, 202 p. : ill., digital ; 25 cm.

ISBN: 9780387260167 (electronic bk.) 9780387258003 (paper)

Subjects--Topical Terms:
Electron microscopy.
Chemistry.
Characterization and Evaluation Materials.
Biological Microscopy.

LC Class. No.: QH212.E4 / E354 2005

Dewey Class. No.: 502.825

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Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM /

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