Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces /
Kaupp, G.
Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces / G. Kaupp. - Berlin : Springer-Verlag, 2006. - xii, 292 p. : ill. ; 24 cm. - Nanoscience and technology. .
Includes bibliographical references and index.
3540284052 (hbk.) RM433.56
9783540284055 (hbk.)
Atomic force microscopy.
Near-field microscopy.
Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces / G. Kaupp. - Berlin : Springer-Verlag, 2006. - xii, 292 p. : ill. ; 24 cm. - Nanoscience and technology. .
Includes bibliographical references and index.
3540284052 (hbk.) RM433.56
9783540284055 (hbk.)
Atomic force microscopy.
Near-field microscopy.