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Value analysis tear-down : a new process for product development and innovation /

Sato, Yoshihiko

Value analysis tear-down : a new process for product development and innovation / Yoshihiko Sato and J. Jerry Kaufman - New York : Industrial Press, 2005 - x, 206 p. : ill. ; 24 cm.

Includes bibliographical references (p. 199) and index

ISBN: 0831132035 (professional/textbook : alk. paper) RM156.87

Subjects--Topical Terms:
Value analysis (Cost control)
Industrial productivity
New products
Engineering economy

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Value analysis tear-down : a new process for product development and innovation /

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