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Electron microscopy and analysis /

Goodhew, Peter J.

Electron microscopy and analysis / Peter J. Goodhew, John Humphreys, Richard Beanland - 3rd ed. - London : Taylor & Francis, 2001 - x, 251 p. : ill. ; 24 cm.

Includes bibliographical references (p. [236]-237) and index

ISBN: 0748409688 (pbk.) RM210.80

Subjects--Topical Terms:
Electron microscopy

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Electron microscopy and analysis /

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