BIST based on reseeding of LFSRs

Venkataraman, Srikanth

BIST based on reseeding of LFSRs [microform] / Srikanth Venkataraman - Montreal : Perpustakaan Tun Seri Lanang, 2006 - 1 microfilm reel ; 35 mm.

Thesis (Master of Engineering) - McGill University, Montreal, 1993

RM147.20


Digital integrated circuits--Testing
Integrated circuits--Very large scale integration--Testing

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