Normal view MARC view ISBD view

Failure-free integrated circuit packages : systematic elimination of failures through reliability engineering, failure analysis, and material improvements /

Failure-free integrated circuit packages : systematic elimination of failures through reliability engineering, failure analysis, and material improvements / Charles Cohn, Charles A. Harper, [editors] - New York : McGraw-Hill, 2005 - xix, 363 p. : ill. ; 24 cm. - McGraw-Hill professional engineering .

Includes bibliographical references and index

Subjects--Topical Terms:
Microelectronic packaging
Integrated circuits--Fault tolerance

Place hold
Print
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)

Failure-free integrated circuit packages : systematic elimination of failures through reliability engineering, failure analysis, and material improvements /

Contact Us

Copyright ©The National University of Malaysia Library