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Thin film analysis by x-ray scattering /

Birkholz, Mario.

Thin film analysis by x-ray scattering / Mario Birkholz ; with contributions by Paul F. Fewster, Christoph Genzel. - Weinheim : Wiley-VCH, 2006. - xxii, 356 p. : ill. ; 25 cm.

ISBN: 3527310525 RM373.18

Subjects--Topical Terms:
Thin films--Analysis.
X-ray spectroscopy.

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