Semiconductor memories : technology, testing, and reliability /
Sharma, Ashok K.
Semiconductor memories : technology, testing, and reliability / Ashok K. Sharma - New York : IEEE (Institute of Electrical and Electronic Engineers), 1997 - xii, 462 p. : ill. ; 26 cm.
'IEEE Solid-State Circuits Council, sponsor.'
Includes bibliographical references and index
0780310004 RM502.30
2003-533030
Semiconductor storage devices
Semiconductor memories : technology, testing, and reliability / Ashok K. Sharma - New York : IEEE (Institute of Electrical and Electronic Engineers), 1997 - xii, 462 p. : ill. ; 26 cm.
'IEEE Solid-State Circuits Council, sponsor.'
Includes bibliographical references and index
0780310004 RM502.30
2003-533030
Semiconductor storage devices