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Microprobe characterization of optoelectronic materials /

Microprobe characterization of optoelectronic materials / edited by Juan Jimenez. - New York : Taylor & Francis, 2003. - xiv, 715 p. : ill. ; 24 cm. - Optoelectronic properties of semiconductors and superlattices ; vol. 17. .

Includes bibliographical references and index.

ISBN: 1560329416 (alk. paper) RM1179.85

Subjects--Topical Terms:
Semiconductors--Optical properties.
Microprobe analysis.

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Microprobe characterization of optoelectronic materials /

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