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VLSI circuit testing using probabilistic approach

Ahmed, Iftekhar

VLSI circuit testing using probabilistic approach [microform] / Iftekhar Ahmed - Bangi : Perpustakaan Tun Seri Lanang , 2003 - 1 microfilm reel ; 35 mm .

Subjects--Topical Terms:
Integrated circuits--Large scale integration

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VLSI circuit testing using probabilistic approach

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