An approach to current sensor and test processor design for simultaneous logic and IDDQ testing of CMOS integrated circuits
Altaf-ul-Amin, Md.
An approach to current sensor and test processor design for simultaneous logic and IDDQ testing of CMOS integrated circuits [microform] / Md. Altaf-ul-Amin - Bangi : Perpustakaan Tun Seri Lanang, 1999 - 1 microfilm reel ; 35 mm.
Thesis (M.Sc.) - Universiti Kebangsaan Malaysia, 1999
Integrated circuits--Very large scale integration--Testing
Iddq testing
Metal oxide semiconductors, Complementary--Testing
An approach to current sensor and test processor design for simultaneous logic and IDDQ testing of CMOS integrated circuits [microform] / Md. Altaf-ul-Amin - Bangi : Perpustakaan Tun Seri Lanang, 1999 - 1 microfilm reel ; 35 mm.
Thesis (M.Sc.) - Universiti Kebangsaan Malaysia, 1999
Integrated circuits--Very large scale integration--Testing
Iddq testing
Metal oxide semiconductors, Complementary--Testing