Built-in test design for the efficient testing of VSLI circuits (microform) /

Molyneaux, Robert F.

Built-in test design for the efficient testing of VSLI circuits (microform) / by Robert F. Molyneaux - Ann Arbor, Mich. : University Microfilms International, 1991 - 2 microfiches ; 11 x 15 cm.

Thesis (Ph.D.) -The University of Rochester, 1991


Integrated circuits--Very large scale integration--Testing

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