Normal view MARC view ISBD view

Semiconductor material and device characterization /

Schroder, Dieter K.

Semiconductor material and device characterization / Dieter K. Schroder. - 2nd ed. - New York : John Wiley & Sons, 1998. - xxiv, 760 p. : ill. ; 25 cm.

'A Wiley-Interscience publication.'

Includes bibliographical references and index.

ISBN: 0471241393 RM420.25

LCCN: 97-052094

Subjects--Topical Terms:
Semiconductors.
Semiconductors--Testing.

Place hold
Print
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)

Semiconductor material and device characterization /

Contact Us

Copyright ©The National University of Malaysia Library