An approach to current sensor and test processor design for simultaneous logic and IDDQ testing of CMOS integrated circuits /
Altaf-ul-Amin, Md.
An approach to current sensor and test processor design for simultaneous logic and IDDQ testing of CMOS integrated circuits / Md. Altaf-ul-Amin - Bangi : Fakulti Kejuruteraan, Universiti Kebangsaan Malaysia, 1999 - xiv, 142 p. : ill. ; 30 cm.
Thesis (M.Sc.) - Universiti Kebangsaan Malaysia, 1999
References: p. 106-109
Integrated circuits--Very large scale integration--Testing
Iddq testing
Metal oxide semiconductors, Complementary--Testing
An approach to current sensor and test processor design for simultaneous logic and IDDQ testing of CMOS integrated circuits / Md. Altaf-ul-Amin - Bangi : Fakulti Kejuruteraan, Universiti Kebangsaan Malaysia, 1999 - xiv, 142 p. : ill. ; 30 cm.
Thesis (M.Sc.) - Universiti Kebangsaan Malaysia, 1999
References: p. 106-109
Integrated circuits--Very large scale integration--Testing
Iddq testing
Metal oxide semiconductors, Complementary--Testing