BIST based on reseeding of LFSRs /
Venkataraman, Srikanth
BIST based on reseeding of LFSRs / Srikanth Venkataraman - Montreal : McGill University, 1993 - ix, 96 p. : ill. ; 29 cm.
Thesis (Master of Engineering) - McGill University, Montreal, 1993
RM147.20
Digital integrated circuits--Testing
Integrated circuits--Very large scale integration--Testing
BIST based on reseeding of LFSRs / Srikanth Venkataraman - Montreal : McGill University, 1993 - ix, 96 p. : ill. ; 29 cm.
Thesis (Master of Engineering) - McGill University, Montreal, 1993
RM147.20
Digital integrated circuits--Testing
Integrated circuits--Very large scale integration--Testing