Normal view MARC view ISBD view

Integrated circuit failure analysis : a guide to preparation techniques /

Beck, Friedrich.

Integrated circuit failure analysis : a guide to preparation techniques / A guide to preparation techniques. Friedrich Beck ; translated by Stephen S. Wilson. - Chichester : John Wiley & Sons, 1998. - 173 p. : ill. ; 25 cm. - Wiley series in quality and reliability engineering. .

ISBN: 0471974013 RM273.16

Subjects--Topical Terms:
Semiconductors--Failures.
Semiconductors--Testing.

Place hold
Print
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)

Integrated circuit failure analysis : a guide to preparation techniques /

Contact Us

Copyright ©The National University of Malaysia Library