X-ray microscopy : proceedings of the International Symposium, Gottingen, Fed. Rep. of Germany, September, 14-16, 1983 /

X-ray microscopy : proceedings of the International Symposium, Gottingen, Fed. Rep. of Germany, September, 14-16, 1983 / edited by G. Schmahl and D. Rudolph - Berlin : Springer-Verlag, 1984 - 345 p. : ill. ; 24 cm. - Springer series in optical sciences; 43 .

Includes bibliographies references

3540132716


X-ray Microscope--Congresses

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