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VLSI circuit testing using probabilistic approach

Ahmed, Iftekhar

VLSI circuit testing using probabilistic approach Iftekhar Ahmed - Bangi Universiti Kebangsaan Malaysia 1995 - 182 p. : ill. ; 30 cm.

Thesis (Doctor of Philosophy) - Universiti Kebangsaan Malaysia, 1995

Subjects--Topical Terms:
Integrated circuits--Large scale integration

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VLSI circuit testing using probabilistic approach

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