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Secondary ion mass spectometry : SIMS VI : proceedings of the sixth international conference on secondary ion mass spectrometry (SMIS VI) : palais des congres, Versailles, Paris, France September 13-18th, 1987 /

Secondary ion mass spectometry : SIMS VI : proceedings of the sixth international conference on secondary ion mass spectrometry (SMIS VI) : palais des congres, Versailles, Paris, France September 13-18th, 1987 / editors A. Benninghoven ... (et al.). - Chichester : John Wiley & Sons 1988 - 1078 p. : ill. ; 24 cm.

ISBN: 0471918326

Subjects--Topical Terms:
Secondary ion mass spectrometry--Congresses.

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Secondary ion mass spectometry : SIMS VI : proceedings of the sixth international conference on secondary ion mass spectrometry (SMIS VI) : palais des congres, Versailles, Paris, France September 13-18th, 1987 /

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