Normal view MARC view ISBD view

Physical measurement and analysis of thin films/

Physical measurement and analysis of thin films/ edited by E. M. Murt and W. G. Guldner. - New York: Plenum Press, 1969. - xi, 194 p. : ill. ; 24 cm.

Includes bibliographies.

Subjects--Topical Terms:
Thin films.

Place hold
Print
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)

Physical measurement and analysis of thin films/

Contact Us

Copyright ©The National University of Malaysia Library