Neural models and algorithms for digital testing /
Chakradhar, Srimat T.
Neural models and algorithms for digital testing / by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell. - Boston : Kluwer Academic Publishers, 1991. - 184 p. : ill. ; 24 cm.
0792391659 RM190.61
Logic circuits--Testing.
Automatic checkout equipment.
Digital integrated circuits--Testing--Data processing.
Neural models and algorithms for digital testing / by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell. - Boston : Kluwer Academic Publishers, 1991. - 184 p. : ill. ; 24 cm.
0792391659 RM190.61
Logic circuits--Testing.
Automatic checkout equipment.
Digital integrated circuits--Testing--Data processing.