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An investigation of deep levels in silicon

Sandow, Peter Micheal, 1947-

An investigation of deep levels in silicon [microform] / by Peter Micheal Sandow. - Ann Arbor, Mich. : University Microfilms International , 1978. - 2 microfiches ; 11 x 15 cm.

Thesis (Ph.D.) - Pennsylvania State University, 1977.

Subjects--Topical Terms:
Semiconductors--Silicon.

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An investigation of deep levels in silicon

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